大島商船高等専門学校紀要

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大島商船高等専門学校紀要 Volume 47
published_at 2014-12

Analysis of semiconductor devices by means of the I-V measurement system

電流―電圧特性解析装置を使用した電子デバイスの解析
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OS10047000006.pdf
Descriptions
In this report, I(current) - V(voltage) characteristics measurement system was constructed for analyzing semiconductor devices, and this system was applied to Semiconductor diodes. Semiconductor diode has many unique characteristics on configuration form, and mechanism of characteristics on configuration form was less well understood. We found three different I-V characteristics in measurement of Semiconductor diodes, and we considered a mechanism model to three different I-V characteristics.
Creator Keywords
I-V characteristics
semiconductor device
diode