Okamura Yoshinobu
A method of predicting the field failure rate caused by electromigration with stressed test data
宇部工業高等専門学校研究報告 Volume 42
Page 11-14
published_at 1996-03
Title
エレクトロマイグレーション故障の加速試験に基づく市場故障率予測の方法
A method of predicting the field failure rate caused by electromigration with stressed test data
Creators
Miyamoto Hidenori
Source Identifiers
Languages
jpn
Resource Type
departmental bulletin paper
Publishers
宇部工業高等専門学校
Date Issued
1996-03
File Version
Version of Record
Access Rights
open access
Relations
[ISSN]0386-4359