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A method of predicting the field failure rate caused by electromigration with stressed test data

宇部工業高等専門学校研究報告 Volume 42 Page 11-14
published_at 1996-03
UN20042000003.pdf
[fulltext] 239 KB
Title
エレクトロマイグレーション故障の加速試験に基づく市場故障率予測の方法
A method of predicting the field failure rate caused by electromigration with stressed test data
Creators Okamura Yoshinobu
Creators Miyamoto Hidenori
Source Identifiers
Languages jpn
Resource Type departmental bulletin paper
Publishers 宇部工業高等専門学校
Date Issued 1996-03
File Version Version of Record
Access Rights open access
Relations
[ISSN]0386-4359