Ueda Yoshifumi

Perfomance Test of Inverse Photoemission Spectrometer and Study of Conduction Band Structure of Te Single Crystal

published_at 1991-12-01

Title

逆光電子分光装置の性能評価とTeの伝導帯構造の研究

Perfomance Test of Inverse Photoemission Spectrometer and Study of Conduction Band Structure of Te Single Crystal

Creators Ueda Yoshifumi

Creators Asai Seiichi

Creators Yokoyama Kouichi

Creators Nishihara Katsuhiro

Creators Taniguchi Masaki

Creators Seki Kazuhiko

Creators Ohta Toshiaki

Source Identifiers [PISSN] 0386-2542 [NCID] AN00172830

Languages jpn

Resource Type departmental bulletin paper

Publishers 徳山工業高等専門学校

Date Issued 1991-12-01

File Version Not Applicable (or Unknown)

Access Rights metadata only access

Relations

[ISSN]0386-2542

[NCID]AN00172830