Ichibakase Tsuyoshi
Analysis of semiconductor devices by means of the I-V measurement system
大島商船高等専門学校紀要 Volume 47
Page 41-49
published_at 2014-12
Title
電流―電圧特性解析装置を使用した電子デバイスの解析
Analysis of semiconductor devices by means of the I-V measurement system
Source Identifiers
Creator Keywords
I-V characteristics
semiconductor device
diode
In this report, I(current) - V(voltage) characteristics measurement system was constructed for analyzing semiconductor devices, and this system was applied to Semiconductor diodes. Semiconductor diode has many unique characteristics on configuration form, and mechanism of characteristics on configuration form was less well understood. We found three different I-V characteristics in measurement of Semiconductor diodes, and we considered a mechanism model to three different I-V characteristics.
Languages
jpn
Resource Type
departmental bulletin paper
Publishers
大島商船高等専門学校
Date Issued
2014-12
File Version
Version of Record
Access Rights
open access
Relations
[ISSN]0387-9232
[NCID]AN00031668