Perfomance Test of Inverse Photoemission Spectrometer and Study of Conduction Band Structure of Te Single Crystal
徳山工業高等専門学校研究紀要 Volume 15
Page 123-132
published_at 1991-12-01
Title
逆光電子分光装置の性能評価とTeの伝導帯構造の研究
Perfomance Test of Inverse Photoemission Spectrometer and Study of Conduction Band Structure of Te Single Crystal
Creators
Asai Seiichi
Creators
Yokoyama Kouichi
Creators
Nishihara Katsuhiro
Creators
Taniguchi Masaki
Creators
Seki Kazuhiko
Creators
Ohta Toshiaki
Source Identifiers
[PISSN] 0386-2542
[NCID] AN00172830
Languages
jpn
Resource Type
departmental bulletin paper
Publishers
徳山工業高等専門学校
Date Issued
1991-12-01
File Version
Not Applicable (or Unknown)
Access Rights
metadata only access
Relations
[ISSN]0386-2542
[NCID]AN00172830