Analysis of semiconductor device by means of the I-V measurement system
大島商船高等専門学校紀要 Volume 46
Page 13-19
published_at 2013-12
Title
高精度電子デバイス電気特性解析装置を使用した電子デバイスの解析
Analysis of semiconductor device by means of the I-V measurement system
Source Identifiers
Creator Keywords
I-V characteristics
semiconductor device
Varistor
In this report, I(current) - V(voltage) characteristics measurement system was constructed for analyzing semiconductor devices, and this system was applied to Varistor. Varistor has many unique characteristics, and mechanism of characteristics was less well understood. We found three different I-V characteristics in measurement of Varistor, and we applied a mechanism model to three different I-V characteristics.
Languages
jpn
Resource Type
departmental bulletin paper
Publishers
大島商船高等専門学校
Date Issued
2013-12
File Version
Version of Record
Access Rights
open access
Relations
[ISSN]0387-9232
[NCID]AN00031668