コンテンツメニュー

Kaya Masaki


Electrical property analysis system for electronic elemental devices

大島商船高等専門学校紀要 Volume 41 Page 47-54
published_at 2008-12
OS10041000007.pdf
[fulltext] 1.19 MB
Title
高精度電子デバイス電気特性解析装置
Electrical property analysis system for electronic elemental devices
Creators Ichibakase Tsuyoshi
Creators Kaya Masaki
Source Identifiers
Creator Keywords
V-I characteristics transport properties semiconductor device optical device
Basic characteristics of the electronic devices are able to figure out from V-I characteristics. We built up the analysis system that was able to measure V-I characteristics of the elemental devices, in order to find the basic characteristic, the semiconductor junction characteristics, and the inner structures. Before designing of the system, we deliberated about high accuracy circuit, and tried to build up it. After this, we tried to apply this system to measuring the diodes and transistors, and tested the capability of this system. Conformation of the diodes and transistors differ a little from one to another, because of applications. Characteristics of conformation difference are able to be determined from V-I characteristics. From the V-I characteristics of the diodes and transistors, it was got a gratifying result of the semiconductor junction characteristics.
Languages jpn
Resource Type departmental bulletin paper
Publishers 大島商船高等専門学校
Date Issued 2008-12
File Version Version of Record
Access Rights open access
Relations
[ISSN]0387-9232
[NCID]AN00031668