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Ichibakase Tsuyoshi


Analysis of semiconductor devices by means of the I-V measurement system

大島商船高等専門学校紀要 Volume 47 Page 41-49
published_at 2014-12
OS10047000006.pdf
[fulltext] 1.24 MB
Title
電流―電圧特性解析装置を使用した電子デバイスの解析
Analysis of semiconductor devices by means of the I-V measurement system
Creators Ichibakase Tsuyoshi
Source Identifiers
Creator Keywords
I-V characteristics semiconductor device diode
In this report, I(current) - V(voltage) characteristics measurement system was constructed for analyzing semiconductor devices, and this system was applied to Semiconductor diodes. Semiconductor diode has many unique characteristics on configuration form, and mechanism of characteristics on configuration form was less well understood. We found three different I-V characteristics in measurement of Semiconductor diodes, and we considered a mechanism model to three different I-V characteristics.
Languages jpn
Resource Type departmental bulletin paper
Publishers 大島商船高等専門学校
Date Issued 2014-12
File Version Version of Record
Access Rights open access
Relations
[ISSN]0387-9232
[NCID]AN00031668