コンテンツメニュー

Ichibakase Tsuyoshi


Analysis of semiconductor device by means of the I-V measurement system

大島商船高等専門学校紀要 Volume 46 Page 13-19
published_at 2013-12
OS10046000003.pdf
[fulltext] 748 KB
Title
高精度電子デバイス電気特性解析装置を使用した電子デバイスの解析
Analysis of semiconductor device by means of the I-V measurement system
Creators Ichibakase Tsuyoshi
Source Identifiers
Creator Keywords
I-V characteristics semiconductor device Varistor
In this report, I(current) - V(voltage) characteristics measurement system was constructed for analyzing semiconductor devices, and this system was applied to Varistor. Varistor has many unique characteristics, and mechanism of characteristics was less well understood. We found three different I-V characteristics in measurement of Varistor, and we applied a mechanism model to three different I-V characteristics.
Languages jpn
Resource Type departmental bulletin paper
Publishers 大島商船高等専門学校
Date Issued 2013-12
File Version Version of Record
Access Rights open access
Relations
[ISSN]0387-9232
[NCID]AN00031668